| 光谱学与光谱分析 |
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| Study on Spectrum Analysis of X-Ray Based on Rotational Mass Effect in Special Relativity |
| YU Zhi-qiang, XIE Quan*, XIAO Qing-quan |
| Institute of Advanced Optoelectronic Materials and Technology, College Science of Guizhou University, Guiyang 550025, China |
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Abstract Based on special relativity, the formation mechanism of characteristic X-ray has been studied, and the influence of rotational mass effect on X-ray spectrum has been given. A calculation formula of the X-ray wavelength based upon special relativity was derived. Error analysis was carried out systematically for the calculation values of characteristic wavelength, and the rules of relative error were obtained. It is shown that the values of the calculation are very close to the experimental values, and the effect of rotational mass effect on the characteristic wavelength becomes more evident as the atomic number increases. The result of the study has some reference meaning for the spectrum analysis of characteristic X-ray in application.
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Received: 2009-05-05
Accepted: 2009-08-06
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Corresponding Authors:
XIE Quan
E-mail: qxie@gzu.edu.cn
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