Surface and Interface Analysis of PTCDA/ITO Using X-Ray Photoelectron Spectroscopy (XPS)
OU Gu-ping1, 2,SONG Zhen3,GUI Wen-ming1,ZHANG Fu-jia1*
1. School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China 2. School of Physics, Hunan University of Science and Technology, Xiangtan 411201, China 3. School of Basic Courses, Beijing Institute of Machinery, Beijing 100085, China
Abstract：X-ray photoelectron spectroscopy (XPS) of surface and interface of PTCDA/ITO in PTCDA/p-Si organic-on-inorganic photoelectric detector was investigated. From C1s fine spectrum we found that the binding energy of C atoms in perylene rings was 284.6 eV; and the binding energy of C atoms in acid radical was 288.7 eV; moreover, some C atoms were oxidized by O atoms from ITO. The binding energy of O atoms in CO bonds and C—O—C bonds was 531.5 and 533.4 eV, respectively. At the interface, the peak of high binding energy in C1s spectrum disappeared, and the main peak shifted toward lower binding energy.
Key words：Surface and interface;X-ray photoelectron spectroscopy(XPS);PTCDA/ITO
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