| 光谱学与光谱分析 |
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| Study of the Raman-AFM System for Simultaneous Measurements of Raman Spectrum and Micro/Nano-Structures |
| SHI Bin, ZHANG Hai-jun, WU Lan, ZHANG Dong-xian* |
| State Key Laboratory of Modern Optical Instruments, Zhejiang University, Hangzhou 310027, China |
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Abstract This paper proposes a novel technique of Raman-atomic force microscopy (AFM) combining micro region Raman spectroscopy and AFM imaging. An in-situ probe unit which can simultaneously realize the detection of Raman spectrum and the measurement of AFM image was designed, and a related Raman-AFM system was constructed. Using this system, some experiments were carried out to acquire micro region Raman spectra and AFM images of ZnO nano-particle and TiO2 film. The results show that the Raman spectra of both samples are in agreement with theoretical vaues, and the AFM images represent their micro/nano-structures quite well. These researches prove the feasibility of the Raman-AFM technique which has the potential of being widely applied in the fields of Raman spectroscopy and micro/nano-technology.
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Received: 2011-08-11
Accepted: 2011-11-28
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Corresponding Authors:
ZHANG Dong-xian
E-mail: zhangdx@zju.edu.cn
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