| 光谱学与光谱分析 |
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| Determination of Optical Axis of Quartz wave Plate Based on Spectroscopic Ellipsometer |
| ZHANG Bei-bei, HAN Pei-gao*, FU Shi-rong, ZHU Jiu-kai, YAN Ke-zhu* |
| Shandong Provincial Key Laboratory of Laser Polarization and Information Technology，Laser Institute, Qufu Normal University, Qufu 273165, China |
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Abstract The optical axis is one of the most important parameters in the application of wave plates. In the transmission mode of spectroscopic ellipsometer, taking the advantage of Jones matrix to analyse the phase difference of P and S directions in the process of spinning wave plate, a new method for the determination of optical axis of quartz wave plate was designed. The method has characteristics of simple light path structure and high efficiency in the judging of the optical axis, and this method thus got a good practicability.
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Received: 2012-06-29
Accepted: 2012-10-05
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Corresponding Authors:
HAN Pei-gao, YAN Ke-zhu
E-mail: pghan@foxmail.com; yankezhu@126.com
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