| 光谱学与光谱分析 |
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| Quantitative Inversion of Rock SiO2 Content Based on Thermal Infrared Emissivity Spectrum |
| YANG Hang1, 2, ZHANG Li-fu1*, HUANG Zhao-qiang3, ZHANG Xue-wen1, 2, TONG Qing-xi1 |
1. The State Key Laboratory of Remote Sensing Sciences, Institute of Remote Sensing Applications, Chinese Academy of Sciences, Beijing 100101, China
2. Graduate University of Chinese Academy of Sciences, Beijing 100049, China
3. Institute of Mineral Resources, China Metallurgical Geology Bureau, Beijing 100025, China |
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Abstract The present paper used the emissivity of non-processed rocks measured by M304, a hyperspectral Fourier transform infrared (FTIR) spectroradiometer, and SiO2 content by the X-ray fluorescence spectrometry. After continuum removal and normalization, stepwise regress method was employed to select the feature bands of rocks emissivity. And then quantitative relationship between SiO2 content and continuum removal emissivity of feature bands was analysed. Based on that, by comparing twelve SiO2 indices models, the optimal model for predicting SiO2 content was built. The result showed that the SiO2 indices can predict SiO2 content efficiently, and especially the normalization silicon dioxide index (NSDI) about 11.18 and 12.36 μm is the best; compared with regression models, NSDI is simpler and has higher practicality; the result has an important application value in rock classification and SiO2 content extraction with high precision.
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Received: 2011-10-19
Accepted: 2012-01-18
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Corresponding Authors:
ZHANG Li-fu
E-mail: zhanglf@irsa.ac.cn
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