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Research Advances in In-Situ X-Ray Fluorescence Analysis Technology |
GE Liang-quan, LI Fei* |
Applied Nuclear Technology in Geosciences Key Laboratory of Sichuan Province, Chengdu University of Technology, Chengdu 610059, China |
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Abstract In-situ X-ray fluorescence analysis technology is an instrumental analysis technology for rapid qualitative and quantitative analysis of elements in the measured object under in-situ working conditions. It is widely used in some fields where large analytical instruments and chemical analysis methods cannot be directly operated. This paper reviews the research progress of in-situ X-ray fluorescence analysis technology in China in the past 20 years. The research progress and main technical characteristics of in-situ X-ray spectrometer are reviewed from the perspectives of in-situ analysis and in-situ sampling analysis. The vital technical problems of in-situ analysis data processing of X-ray spectrum are discussed. The representative applications of X-ray spectrum analysis in the geological survey, environmental pollution investigation, identification of cultural relics and alloy analysis are introduced. The research status and progress of in-situ X-ray spectrometers in the world are evaluated. The potential research directions put forward to make great progress in more application fields.
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Received: 2020-05-07
Accepted: 2020-09-24
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Corresponding Authors:
LI Fei
E-mail: lifeimvp@sina.com
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