加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2012, Vol. 32 Issue (02): 313-316    DOI: 10.3964/j.issn.1000-0593(2012)02-0313-04
光谱学与光谱分析 |
The Linearity Analysis of Ultrahigh Temperature FTIR Spectral Emissivity Measurement System
WANG Zong-wei1, DAI Jing-min1, HE Xiao-wa2, YANG Chun-ling1
1. School of Electrical Engineering and Automation,Harbin Institute of Technology, Harbin 150001, China
2. Aerospace Research Institute of Material and Processing Technology, Beijing 100076, China