Abstract:Based on a high-temperature blackbody and a double grating spectral comparison measurement system, the new primary standard apparatus of spectral irradiance was developed at the National Institute of Metrology (NIM) in the spectral wavelength from 230 to 2 550 nm. Stable 1 000 W tungsten halogen lamps are the secondary primary standard for spectral irradiance values. The temperature measurement of the high-temperature blackbodies was traced to the Pt-C and Re-C fixed-point blackbodies and checked against the WC-C fixed-point blackbody at 3 021 K. From 2017 to 2019, NIM participated in the new international comparison of spectral irradiance CCPR-K1 using the newly developed primary standard apparatus. An organized by BIPM. The comparison was piloted by VNIIOFI from Russia, with 12 laboratories participating. The comparison results show that, except for a few laboratories, the consistency of the participated laboratories is ±2.0%, ±1.0%, and ±2.0% at wavelengths of 250 to 290 nm, 300 to 1 300 nm, and 1 500 to 2 500 nm. The average relative deviation between NIM and the KCRV(key comparison reference values)is 0.13%, 0.28% and 0.15%, respectively, in the ultraviolet, visible, and near-infrared wavelengths. The whole wavelength from 250 to 2 500 nm, the average relative deviation between NIM and the KCRV is 0.17%. Compared with the average relative deviation of 0.9% in 2004, the measurement capability of spectral irradiancehas significantly improved.
Key words:Spectral irradiance; International comparison; High temperature blackbody; Measurement uncertainty; National primary standard
代彩红,王彦飞,李 玲,吴志峰,谢一航. 光谱辐射照度国际关键比对装置、方法与结果分析[J]. 光谱学与光谱分析, 2025, 45(01): 1-7.
DAI Cai-hong, WANG Yan-fei, LI Ling, WU Zhi-feng, XIE Yi-hang. Apparatus, Method and Result Analysis of International Key Comparison for Spectral Irradiance. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2025, 45(01): 1-7.
[1] DAI Cai-hong, WU Zhi-feng, OUYANG Hui-quan, et al(代彩红,吴志峰,欧阳慧泉,等). Acta Metrologica Sinica(计量学报), 2013, 34(3):201.
[2] Dai Caihong, Wu Zhifeng, Yu Jialin. SPIE. 8910: 89100D-1~8, International Symposium on Photoelectronic Detection and Imaging 2013. Beijing, China.
[3] Suzuki M,Ooba N. Metrologia, 1976,12(3): 123.
[4] Walker J H, Robert D Saunders, Jackson K, et al. Journal of Research of the National Institute of Standards and Technology, 1991, 96(6): 647.
[5] Woolliams Emma R, Fox Nigel P, Cox Maurice G, et al. Metrologia, 2006,43(2):S98.
[6] Woolliams E R, Cox M G, Fox N P, et al. Final Report of the CCPR K1-a Key Comparison of Spectral Irradiance 250 nm to 2500 nm. 2006.
[7] Dai Caihong, Boris Khlevnoy, Wu Zhifeng, et al. MAPAN-Journal of Metrology Society of India, 2017, 32(3): 243.
[8] Dai Caihong, Wu Zhifeng, Wang Yanfei, et al. Applied Optics, 2020, 59(27): 8494.
[9] Dai Caihong,Wang Yanfei, Li Ling, et al. Metrologia, 2022, 59(2): 024001.
[10] Khlevnoy Boris, Solodilov Maksim, Kolesnikova Svetlana, et al. Metrologia, 2023, 60(1A): 02002.