Boundary Threshold Value Method Used in Crystalline Material Internal Defect Detection by Short Wavelength X-Ray Diffraction
MU Jian-lei1，ZHANG Jin1*，GAO Zheng-huan1，ZHENG Lin2，HE Chang-guang2
1. Beijing Key Laboratory for Corrosion, Erosion and Surface Technology, University of Science and Technology Beijing, Beijing 100083, China 2. Institute of Southwest Technology Engineering, Chongqing 400039, China
Abstract：There are few references about crystalline material internal defect detected by X-ray diffraction tomography using common X-ray source. Short wavelength X-ray diffractometer (SWXRD), invented by Institute of Southwest Technology Engineering, is a relatively small and inexpensive instrument compared to synchrotron radiation or neutron reactor. Boundary determination of defect affects the imaging quality and the distinguishing of defect in X-ray diffraction tomography using SWXRD. In the present paper, threshold value method of diffracted intensity is put forward to process the test data, so the boundary of defect is legible. In order to study how the factors influence the threshold value, Gauss function is used in fitting the test data. The influence of varisized image quality indicator pressed in powdered aluminum on threshold value has been studied. The result shows that 91% of the diffraction intensity of substrate can be regarded as the threshold value. The experiment of slit in aluminum alloy sheet further verified the threshold value method. It’s useful in detecting the defect boundary.
Key words：Short wavelength X-ray;Diffraction tomography;Threshold value method;Internal defect;Crystal materials
牟建雷1，张 津1*，高振桓1，郑 林2，何长光2 . 短波长X射线衍射检测晶体材料内部缺陷的边界阈值法[J]. 光谱学与光谱分析, 2011, 31(06): 1712-1716.
MU Jian-lei1，ZHANG Jin1*，GAO Zheng-huan1，ZHENG Lin2，HE Chang-guang2 . Boundary Threshold Value Method Used in Crystalline Material Internal Defect Detection by Short Wavelength X-Ray Diffraction . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2011, 31(06): 1712-1716.
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