| 光谱学与光谱分析 |
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| Research on the SPR Properties of Copper Thin Film with Regulation of Titanium Dioxide |
| SANG Xiao-zhou, ZHANG Da-wei* |
| Engineering Research Center of Optical Instrument and System of Ministry of Education and Shanghai Key Lab of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China |
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Abstract In this paper, we propose the surface plasmon resonance intensity modulation of the metal copper deposited on a titanium oxide thin film. Surface plasmon resonance (SPR) has a broad application prospect in various types of detectors and sensors. We first used the electron beam evaporation to obtain TiO2 thin films with the same thickness, and then we prepared copper film with the thickness ranging from 5 to 80 nm with magnetron sputtering method. The results show that the TiO2 film with different thickness copper thin films own different surface plasmon resonance modulation capability. The thinner copper film shows more obvious regulation. When the copper layer thickness is more than 20 nm, the resonance enhancement effect began to weaken because of better extinction capability.
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Received: 2015-05-08
Accepted: 2015-09-12
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Corresponding Authors:
ZHANG Da-wei
E-mail: dwzhang@usst.edu.cn
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