| 光谱学与光谱分析 |
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| Effects of Chemical Sensitization on Photoelectron Time-Resolved Spectrum |
| LI Xiao-wei, LI Xin-zheng, LAI Wei-dong, JIANG Xiao-li, TIAN Xiao-dong, YANG Shao-peng, FU Guang-sheng |
| College of Physics Science and Technology, Hebei University, Baoding 071002, China |
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Abstract The time-resolved spectra of free photoelectrons and shallow-trapped electrons in the T-grains AgBrI emulsion were simultaneously detected with microwave absorption and dielectric spectrum detection technique. The results indicate that the electron trap effects of sulfur sensitization centers and sulfur-plus-gold sensitization centers are different with equal quantities of Na2S2O3 added. The sulfur sensitization centers acted as a deep electron trap to pick up the electronic decay because of increasing the number of deep trapped electrons, while the sulfur-plus-gold sensitization centers as a shallow electron trap decrease the electronic decay through effectively controlling the recombination between the electrons and the holes. The depth of sulfur-plus-gold sensitization center is shallower than that of sulfur sensitization center after the KAuCl4 is added. The effects of sulfur sensitization center and sulfur-plus-gold sensitization center on the photoelectron decay are different in different sections of decay curves through the change in electron time-resolved spectra.
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Received: 2003-12-27
Accepted: 2004-05-12
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Corresponding Authors:
LI Xiao-wei
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| Cite this article: |
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LI Xiao-wei,LI Xin-zheng,LAI Wei-dong, et al. Effects of Chemical Sensitization on Photoelectron Time-Resolved Spectrum[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2005, 25(06): 815-818.
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| URL: |
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https://www.gpxygpfx.com/EN/Y2005/V25/I06/815 |
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