XPS Analysis of Beads Formed by Fuse Breaking of Electric Copper Wire
WU Ying, MENG Qing-shan, WANG Xin-ming, GAO Wei, DI Man
Key Laboratory for Fire Scene Investigation and Evidence Identification, Ministry of Public Security, Shenyang Fire Research Institution, Ministry of Public Security, Shenyang 110034, China
Abstract：The in-depth composition of beads formed by fuse breaking of the electric copper wire in different circumstances was studied by XPS with Ar+ ion sputtering. In addition, the measured Auger spectra and the calculated Auger parameters were compared for differentiation of the substances of Cu and Cu2O. Corresponding to the sputtering depth, the molten product on a bead induced directly by fuse breaking of the copper wire without cover may be distinguished as three portions: surface layer with a drastic decrease in carbon content; intermediate layer with a gentle change in oxygen content and gradually diminished carbon peak, and consisting of Cu2O; transition layer without Cu2O and with a rapid decrease in oxygen content. While the molten product on a bead formed by fuse breaking of the cupper wire after its insulating cover had been burned out may be distinguished as two portions: surface layer with carbon content decreasing quickly; subsurface layer without Cu2O and with carbon and oxygen content decreasing gradually. Thus, it can be seen that there was an obvious interface between the layered surface product and the substrate for the first type of bead, while as to the second type of bead there was no interface. As a result, the presence of Cu2O and the quantitative results can be used to identify the molten product on a bead induced directly by fuse breaking of the copper wire without cover and the molten product on a bead formed by fuse breaking of the cupper wire after its insulating cover had been burned out, as a complementary technique for the judgments of fire cause.
Key words：Depth etching;X-ray photoelectron spectroscopy(XPS);Auger parameter;Electrical short circuit molten mark
吴 莹，孟庆山，王新明，高 伟，邸 曼. 铜导线短路熔痕的XPS研究[J]. 光谱学与光谱分析, 2010, 30(05): 1408-1412.
WU Ying, MENG Qing-shan, WANG Xin-ming, GAO Wei, DI Man . XPS Analysis of Beads Formed by Fuse Breaking of Electric Copper Wire . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2010, 30(05): 1408-1412.
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