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| Design of a SWIR Offner Imaging Spectrometer |
| ZHENG Zhi-zhong1,2, YANG Zhong1*, XIU Lian-cun2, DONG Jin-xin2, CHEN Chun-xia2, GAO Yang2, YU Zheng-kui2 |
1. Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
2. Nanjing Center, China Geological Survey, Nanjing 210016, China |
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Abstract By analyzing the offner spectroscopic optical system, an equation to calculate quickly the initial structural parameters is summed . Based on the calculated initial structural parameters we optimized a set of spectral optics used for short-wave infrared (1 000~2 500 nm), which has been designed with large optics aperture (F/# 2.2), high spectral resolution (better than 10 nm) and long entrance slit (12 mm).Within the entire field of view and wavelength, the modulation transfer function MTF is greater than 0.5.The complete imaging spectrometer with smaller size and light weight (less than 5 kg). The instrument test results show that the spectral linearity over the whole spectral range is good, and after spectral calibration the wavelength accuracy is more than 4 nm. The resolution tests of different bands shows that the spectral resolution over the full wavelength range is consistent with the design, and dynamic imaging experiments show that the spectral images are clear and the spectral data has good quality.
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Received: 2016-04-07
Accepted: 2016-08-25
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Corresponding Authors:
YANG Zhong
E-mail: YangZhong@nuaa.edu.cn
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