| 光谱学与光谱分析 |
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| Investigation of Phase Morphology of PS／PMMA Blend Thin Film by Surface Enhanced Raman Scattering |
| ZONG Qi1, XIE Yu-ming1*, CHEN Feng-en2, YU Jian-yuan2 |
1.Advanced Materials Laboratory, Institute of Polymer Science and Engineering, Department of Chemical Engineering, Tsinghua University, Beijing 100084, China
2.Department of Chemistry, Tsinghua University, Beijing 100084, China |
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Abstract Polystyrene/poly (methyl methacrylate) (PS/PMMA) was studied after the thin films were prepared on glass substrate by spin-coating from THF.Raman spectroscopy combined with microscopy was used to obtain information on the morphology and structure of the thin films.From the relative intensities of the peaks around 1 604 and 1 585 cm-1 due to stretching of benzene rings, and 1 728 cm-1 due to stretching of CO for PS and PMMA respectively, the authors could define the composition of the domains in the sea-island-like phase-separated structure in the microscopic image.Furthermore, the structure evolution was followed by Raman spectroscopy during the in-situ annealing of PS/PMMA (30/70) blend thin films at 210 ℃.And the effect of SERS on the PS thin films was also discussed.
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Received: 2004-03-01
Accepted: 2004-07-16
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Corresponding Authors:
XIE Yu-ming
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| Cite this article: |
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ZONG Qi,XIE Yu-ming,CHEN Feng-en, et al. Investigation of Phase Morphology of PS／PMMA Blend Thin Film by Surface Enhanced Raman Scattering [J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2005, 25(07): 1064-1067.
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https://www.gpxygpfx.com/EN/Y2005/V25/I07/1064 |
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