Abstract:The spectra of root, stem, leaf of soybean samples with 0, 20, 40, 60 mg·L-1 Al3+ were determined by Fourier transform infrared (FTIR) spectrometry with OMNI-sampler. Little difference was found in the spectra of leaf between two soybean cultivars, aluminum-resistant cultivar Zhechun NO.2 and aluminum-sensitive cultivar Zhechun NO.3, except the indices of wave number-absorbance from 928 to 1 200 cm-1, and similar results were also observed in stem and root samples of the two soybean cultivars with 0 mg·L-1 Al3+. However, results from the comparison of the spectra showed some distinguishable differences in the intensity and the shape of absorption peaks of their FTIR spectra from 721 to 3 366 cm-1 of Al-stressed samples and control samples between the two soybean cultivars, and more evident differences of FTIR were exhibited in Al-stressed roots, stems and leaves with higher concentration of Al3+. The increased absorbance at 2 929 and 3 350 cm-1 was found in root FTIR spectra with 20, 40, 60 mg·L-1 Al3+, while roots got maximum absorbance at wave number of 1 375 cm-1 with 20 mg·L-1 Al3+, which decreased with higher concentration of Al3+, and the same results were showed at wave numbers of 1 410, 1 423, 1 549 and 1 645 cm-1. Absorption peak showed maximum at wave numbers of 1 051, 2 850, 2 929 and 3 350 cm-1 in stem FTIR spectra with 60 mg·L-1 Al3+. There was little difference between the spectra of Al-stressed leaves and controls at wave numbers from 1 750 to 2 750 cm-1, but visible difference in leaf spectra was exhibited at other wave number. Moreover, the results showed that the FTIR spectra of aluminum-sensitive cultivar Zhechun NO.3 showed much more observable differences than aluminum-resistant cultivar Zhechun NO.2 with different concentration of Al, implying that the material metaboly of aluminum-sensitive soybean was evidently affected by Al. Therefore, FTIR spectra could be used broadly for identification of the endurance of different soybean cultivars to Al.
Key words:Fourier transform infrared spectroscopy;Soybean;Endurance to Al
张争艳,刘鹏*,陈微微,陈传奇,贾佳. 不同品种大豆耐铝性的FTIR分析研究[J]. 光谱学与光谱分析, 2009, 29(02): 372-377.
ZHANG Zheng-yan,LIU Peng*,CHEN Wei-wei,CHEN Chuan-qi,JIA Jia. FTIR Study of the Endurance to Al of Different Soybean Cultivars. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2009, 29(02): 372-377.
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