Abstract：Under the conditions of the polarized light, The reflective surface of the object is affected by many factors, refractive index, surface roughness, and so the angle of incidence. For the rough surface in the different wavelengths of light exhibit different reflection characteristics of polarization, a spectral polarimetric BRDF based on Kirchhof theory is proposee. The spectral model of complex refraction index is combined with refraction index and extinction coefficient spectral model which were got by using the known complex refraction index at different value. Then get the spectral model of surface roughness derived from the classical surface roughness measuring method combined with the Fresnel reflection function. Take the spectral model of refraction index and roughness into the BRDF model, then the spectral polarimetirc BRDF model is proposed. Compare the simulation results of the refractive index varies with wavelength, roughness is constant, the refraction index and roughness both vary with wavelength and origin model with other papers, it shows that, the spectral polarimetric BRDF model can show the polarization characteristics of the surface accurately, and can provide a reliable basis for the application of polarization remote sensing, and other aspects of the classification of substances.
[1] Bartlett B D, Gartley M G, Messinger D W. Journal of Applied Remote Sensing, 2010, 4(1): 043552-21. [2] Prokopenko V T, Alekseev S A, Matveev N V, et al. Optics and Spectroscopy, 2013, 114(6): 961. [3] Priest R G, Gerner T A. Polarimetric BRDF in the Microfacet Model: Theory and Measurements, Naval Research Lab. Washington D C, 2000. [4] He X D, Torrance K E, Sillion F X, et al. ACM SIGGRAPH Computer Graphics, 1991, 25(4): 175. [5] Torrance K E, Sparrow E M. JOSA, 1967, 57(9): 1105. [6] Li H, Torrance K E. Program of Computer Graphics, Tech. Rep. PCG-05-03, Cornell Univ., Ithaca, NY, 2005. [7] Carlson E J. Development of a Spectropolarimetric Remote Sensing Caplbility, Air Force Inst of Tech Wright-Patterson AFB OH Graduate School of Engineering and Management, 2013. [8] Volz F E. Applied Optics, 1972, 11(4): 755. [9] FENG Wei-wei, WEI Qing-nong, WANG Shi-mei(冯巍巍，魏庆农，汪世美). Acta Optica Sinica(光学学报), 2008, 28(2): 290. [10] GAO Ming, SONG Chong, GONG Lei(高 明，宋 冲，巩 蕾). Chinese Journal of Lasers(中国激光)，2013，(12): 225. [11] Bennett H E J, Porteus J O. JOSA, 1961, 51(2): 123. [12] Bennett H E. JOSA, 1963, 53(12): 1389. [13] Goldstein D H. International Symposium on Optical Science and Technology. International Society for Optics and Photonics, 2000. 112.
