Review of Normal Spectral Emissivity Standard Reference Materials
YU Kun1, 2, 3, LIU Yu-fang1, 3*, ZHAO Yue-jin3
1. College of Physics & Information Engineering, Henan Normal University, Xinxiang 453007, China 2. Department of Physics, Xingyi Normal University for Nationalities, Xingyi 562400, China 3. School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
Abstract：In order to improve the accuracy of spectral emissivity measurement, standard reference materials of spectral emissivity as the dissemination of quantity in spectral emissivity measurement are used for the calibration of spectral emissivity measurement apparatus. In the present paper, firstly the standard reference materials data proposed by the American National Institute of Standards and Technology are introduced, and some underlying standard reference materials suggested by some metering departments in Europe are analyzed in detail. For the standard reference material Armco iron and SiC proposed by some researchers, the advantages and disadvantages were explored. Finally, the characteristics of standard reference materials are summarized, and the future development of spectral emissivity measurement standard is prospected.
[1] DAI Jing-min, SONG Yang, WANG Zong-wei(戴景民，宋 扬，王宗伟). Infrared and Laser Engineering(红外与激光工程), 2009, 38(4): 710. [2] Harrison W N, Joseph H M, Plyler E K, et al. National Baureau of Standards，1963, WADC-TR-59-510, Part Ⅳ. [3] Bauer W, Moldenhauer A, Oertel H. Proc of SPIE, 2006, 6205: 62050E. [4] Del Campo L, Pérez-Sáaez R B, Tello M J. Corrosion Science, 2008, 50(1): 194. [5] Wen Changda, Mudawar I. Int. J. Heat. Mass Transfer, 2006, 49(23-24): 4279. [6] Redgrove J S. High Temperatures-High Pressures, 1985, 17(2): 145. [7] Redgrove J S. Meaurement, 1990, 8(2): 90. [8] Battuello M, Lanza F, Ricolfi T. 1989, 21(3): 303. [9] Redgrove J S, Battuello M. High Temperatures-High Pressures, 1995/1996, 27/28(2): 135. [10] Deemyad S, Silvera I F. Review of Scientific Instruments, 2008, 79(8): 086105. [11] Markham J R, Solomon P R, Best P E. Review of Scientific Instruments, 1990, 61(12): 3700. [12] Zhang B, Redgrove J, Clark J. High Temperatures-High Pressures, 2003/2004, 35/36(3): 289. [13] Bauer W, Rink M, Grfen W. Tempmeko, 2004, 2: 1307. [14] Del Campo L, Pérez-Sáaez R B, Esquisabel X, et al. Review of Scientific Instruments, 2006, 77(11): 113111. [15] Del Campo L, Pérez-Sáaez R B, Tello M J, et al. International of Thermophysics, 2006, 27(4): 1160. [16] Silverman S. Journal of the Optical Society of America, 1948, 38(11): 989. [17] Morris J C. Journal of the Optical Society of America, 1961, 51(7): 798. [18] Mitchell C A. Journal of the Optical Society of America, 1962, 52(3): 341. [19] Neuer G. International of Thermophysics, 1995, 16(1): 257. [20] Neuer G, Kochendrfer R, Gern F. High Temperatures-High Pressures, 1995. 27(2): 183. [21] Neuer G, Jaroma-Weiland G. International of Thermophysics, 1998, 19(3): 917. [22] Cagran C P, Hanssen L M, Noorma M, et al. International of Thermophysics, 2007, 28(2): 581. [23] Tsai B K, DeWitt D P, Early E A, et al. Tempmeko, 2004, 2: 1179. [24] WANG Zong-wei, DAI Jing-min, HE Xiao-wa, et al(王宗伟, 戴景民, 何小瓦，等). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2012, 32(2): 313.
