1. Qinghai Institute of Salt Lakes, Chinese Academy of Sciences, Xining 810008, China 2. Graduate University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:A rapid multi-element analysis method for clay mineral samples was described. This method utilized a polarized wavelength dispersive X-ray fluorescence spectrometer—Axios PW4400,which had a maximum tube power of 4 000 watts. The method was developed for the determination of As, Mn, Co, Cu, Cr, Dy, Ga, Mo, P, Pb, Rb, S, Sr, Ni, ,Cs, Ta, Th, Ti, U, V, Y, Zn, Zr, MgO, K2O, Na2O, CaO, Fe2O3, Al2O3, SiO2 and so on. Thirty elements in clay mineral species were measured by X-ray fluorescence spectrometry with pressed powder pellets. Spectral interferences, in particular the indirect interferences of each element, were studied. A method to distinguish the interference between each other periodic elements in element periodic table was put forward. The measuring conditions and existence were mainly investigated,and the selected background position as well as corrected spectral overlap for the trace elements were also discussed. It was found that the indirect spectral overlap line was the same important as direct spectral overlap line. Due to inducing the effect of indirect spectral overlap,some elements jlike Bi,Sn,W which do not need analysis were also added to the elements channel. The relative standard deviation (RSD) was in the range of 0.01% to 5.45% except three elements Mo, Cs and Ta. The detection limits, precisions and accuracies for most elements using this method can meet the requirements of sample analysis in clay mineral species.
Key words:X-ray spectrometry;Spectral overlap;Salt lake deposition;Clay mineral;Reference material
王小欢1,2, 孟庆芬1, 董亚萍1*, 陈美达1,2, 李 武1 . X射线荧光光谱法快速分析盐湖粘土矿物元素含量[J]. 光谱学与光谱分析, 2010, 30(03): 829-833.
WANG Xiao-huan1, 2, MENG Qing-fen1, DONG Ya-ping1*, CHEN Mei-da1, 2,LI Wu1 . Rapid Determination of Major and Trace Elements in the Salt Lake Clay Minerals by X-Ray Fluorescence Spectrometry . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2010, 30(03): 829-833.
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