Development of Aperture Probe Near-Field Raman Spectroscopy and Microscopy
JIANG Yang,REN Bin,TIAN Zhong-qun*
State Key Laboratory for Physical Chemistry of Solid Surfaces and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
Abstract:The appearance of near-field Raman spectroscopy that is based on aperture probe scanning near-field optical microscopy makes the resolution of Raman spectroscopy beyond the optical diffraction limitation. It provided a powerful tool to probe chemical information of sample on subwavelength scale. The present article illustrates the influence of probe character on near-field Raman spectroscopy. Furthermore, the development over ten years in chemical resolution imaging on nanoscale, special properties of liquid-liquid interface, exploring SERS mechanism and observing hotspots beneath subwavelength scale etc. were introduced in detail.
[1] Abbe E. Arch. Mikrosk. Anat., 1873, 9: 413. [2] ZHANG Shu-lin(张树霖). Near-Field Scanning Optical Microscopy and Its Application(近场光学显微镜及其应用). Beijing: Science Press(北京: 科学出版社), 2000. 259. [3] ZHU Xing(朱 星). Modern Scientific Instruments(现代科学仪器), 1996, 4(4): 7. [4] Chen Y. Ccast-W L Workshop SERIES, 1996, 64: 1. [5] ZHANG Shu-lin, ZU Xiao-min(张树霖,祖晓敏). Modern Scientific Instruments(现代科学仪器), 1996, 4(4): 9. [6] WANG Yang, WU Xiao-bin, WANG Jia, et al(王 阳,吴晓斌,王 佳,等). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2006, 26(7): 1253. [7] Zavalin A, Cricenti A, Generosi R, et al. Applied Physics Letters, 2006, 88(13): 133126/1. [8] Synge E H. Philosophical Magazine, 1928, 6: 356. [9] Ash E A, Nicholls G. Nature, 1972, 237(5357): 510. [10] Pohl D W, Denk W, Lanz M. Applied Physics Letters, 1984, 44(7): 651. [11] Lewis A, Isaacson M, Harootunian A, et al. Ultramicroscopy, 1984, 13(3): 227. [12] Reddick R C, Warmack R J, Ferrell T L. Physical Review B, 1989, 39(1): 767. [13] Betzig E, Chichester R J. Science, 1993, 262(5138): 1422. [14] Blatchford J W, Gustafson T L, Epstein A J, et al. Physical Review B, 1996, 54(6): R3683. [15] Ade H, Toledo-Crow R, Vaez-Iravani M, et al. Langmuir, 1996, 12(2): 231. [16] Hwang J, Tamm L K, Bohm C, et al. Science, 1995, 270(5236): 610. [17] Moers M H, Kalle W H, Ruiter A G, et al. Journal of Microscopy, 1996, 182(Pt 1): 40. [18] Enderle T, Ha T, Ogletree D F, et al. Proceedings of the National Academy of Sciences of the United States of America, 1997, 94(2): 520. [19] Ha T, Enderle T, Chemla D S, et al. IEEE Journal of Selected Topics in Quantum Electronics, 1996, 2(4): 1115. [20] Micheletto R, Denyer M, Scholl M, et al. Applied Optics, 1999, 38(31): 6648. [21] Wiederrecht G P. European Physical Journal: Applied Physics, 2004, 28(1): 3. [22] Krenn J R, Lamprecht B, Ditlbacher H, et al. Europhysics Letters, 2002, 60(5): 663. [23] Lee H W, Kim Y M, Jeon D J, et al. Optical Materials, 2003, 21(1-3): 289. [24] Kawata S, Ohtsu M, Irie M, et al. Nano-Optics. Germany: Springer, 2002. 321. [25] Tseng A A. Optics and Laser Technology, 2007, 39(3): 514. [26] Ohtsu M. Editor, Near-Field Nano/Atom Optics and Technology, 1998. 302. [27] Anderson M S, Pike W T. Review of Scientific Instruments, 2002, 73(3, Pt. 1): 1198. [28] Kossakovski D A, O'Connor S D, Widmer M, et al. Ultramicroscopy, 1998, 71(1-4): 111. [29] Kawata S. Topics in Applied Physics, 2001, 81: 15. [30] Kim J, Song K B. Micron, 2007, 38(4): 409. [31] Novotny L, Hecht B, Pohl D W. Ultramicroscopy, 1998, 71(1-4): 341. [32] Karrai K, Grober R D. Applied Physics Letters, 1995, 66(14): 1842. [33] Zhu X, Huang G S, Zhou H T, et al. Solid State Communications, 1996, 98(7): 661. [34] Ruiter A G T, Veerman J A, van der Werf K O, et al. Applied Physics Letters, 1997, 71(1): 28. [35] Abraham M, Ehrfeld W, Lacher M, et al. Ultramicroscopy, 1998, 71(1-4): 93. [36] Betzig E, Trautman J K, Harris T D, et al. Science, 1991, 251(5000): 1468. [37] Turner D R, U. S. Patent, 4469554, 1983. [38] De Serio M, Zenobi R, Deckert V, U. S. Patent, 2003. [39] Dunn R C. Chemical Reviews, 1999, 99(10): 2891. [40] Mulin D, Courjon D, Malugani J-P, et al. Applied Physics Letters, 1997, 71(4): 437. [41] Bouhelier A, Huser T, Tamaru H, et al. Physical Review B, 2001, 63(15): 155404/1. [42] Saiki T, Matsuda K. Applied Physics Letters, 1999, 74(19): 2773. [43] Betzig E, Trautman J K. Science, 1992, 257(5067): 189. [44] Novotny L, Pohl D W, Hecht B. Optics Letters, 1995, 20(9): 970. [45] Emory S R, Nie S. Analytical Chemistry, 1997, 69(14): 2631. [46] Silva T J, Schultz S. Proceedings of SPIE-the International Society for Optical Engineering, 1993, 1855: 180. [47] Dickmann K, Jersch J, Demming F, et al. Photonics Spectra, 1996, 30(9): 80. [48] Kaupp G, Herrmann A, Haak M. Journal of Physical Organic Chemistry, 1999, 12(11): 797. [49] Song K B, Kim J, Park K H. Japanese Journal of Applied Physics, Part 1, 2002, 41(3B): 1724. [50] Song K B, Kim E K, Lee S Q, et al. Japanese Journal of Applied Physics, Part 1, 2003, 42(7A): 4353. [51] Ruiter A G T, Moers M H P, Jalocha A, et al. Ultramicroscopy, 1995, 61(1-4): 139. [52] van Hulst N F, Moers M H P, Noordman O F J, et al. Applied Physics Letters, 1993, 62(5): 461. [53] Minh P N, Ono T, Esashi M. Applied Physics Letters, 1999, 75(26): 4076. [54] Minh P N, Ono T, Esashi M. Review of Scientific Instruments, 2000, 71(8): 3111. [55] Yatsui T, Itsumi K, Kourogi M, et al. Applied Physics Letters, 2002, 80(13): 2257. [56] Pettinger B. Topics in Applied Physics, 2006, 103: 217. [57] Novotny L, Stranick S J. Annual Review of Physical Chemistry, 2006, 57: 303. [58] Zeisel D, Deckert V, Zenobi R, et al. Chemical Physics Letters, 1998, 283(5,6): 381. [59] Hallen H D, Jahncke C L. Journal of Raman Spectroscopy, 2003, 34(9): 655. [60] Taubner T, Hillenbrand R, Keilmann F. Applied Physics Letters, 2004, 85(21): 5064. [61] Staehelin M, Bopp M A, Tarrach G, et al. Applied Physics Letters, 1996, 68(19): 2603. [62] Webster S, Smith D A, Batchelder D N. Vibrational Spectroscopy, 1998, 18(1): 51. [63] Zeisel D, Dutoit B, Deckert V, et al. Analytical Chemistry, 1997, 69(4): 749. [64] La Rosa A H, Yakobson B I, Hallen H D. Applied Physics Letters, 1995, 67(18): 2597. [65] Kavaldjiev D I, Toledo-Crow R, Vaez-Iravani M. Applied Physics Letters, 1995, 67(19): 2771. [66] Smith D A, Webster S, Ayad M, et al. Ultramicroscopy, 1995, 61(1-4): 247. [67] Van Duyne R P, Hulteen J C, Treichel D A. Journal of Chemical Physics, 1993, 99(3): 2101. [68] Tsai D P, Othonos A, Moskovits M, et al. Applied Physics Letters, 1994, 64(14): 1768. [69] Jahncke C L, Paesler M A, Hallen H D. Applied Physics Letters, 1995, 67(17): 2483. [70] Jahncke C L, Hallen H D, Paesler M A. Journal of Raman Spectroscopy, 1996, 27(8): 579. [71] Deckert V, Zeisel D, Zenobi R, et al. Analytical Chemistry, 1998, 70(13): 2646. [72] Paesler M A, Moyer P J, Jahncke C J, et al. Physical Review B, 1990, 42(10): 6750. [73] Ferrell T L, Sharp S L, Warmack R J. Ultramicroscopy, 1992, 42-44(Pt. A): 408. [74] Sharp S L, Warmack R J, Goudonnet J P, et al. Accounts of Chemical Research, 1993, 26(7): 377. [75] Futamata M, Borthen P, Thomassen J, et al. Applied Spectroscopy, 1994, 48(2): 252. [76] Grausem J, Humbert B, Burneau A, et al. Applied Physics Letters, 1997, 70(13): 1671. [77] Grausem J, Humbert B, Spajer M, et al. Journal of Raman Spectroscopy, 1999, 30(9): 833. [78] Humbert B, Grausem J, Spajer M, et al. Chimie Nouvelle, 1999, 17(66): 2023. [79] Ayars E J, Hallen H D. Applied Physics Letters, 2000, 76(26): 3911. [80] Ayars E J, Hallen H D, Jahncke C L. Physical Review Letters, 2000, 85(19): 4180. [81] Zhu S, Yu A W, Hawley D, et al. American Journal of Physics, 1986, 54(7): 601. [82] De Serio M, Bader A N, Heule M, et al. Chemical Physics Letters, 2003, 380(1,2): 47. [83] De Serio M, Mohapatra H, Zenobi R, et al. Chemical Physics Letters, 2006, 417(4-6): 452. [84] Rasmussen A, Deckert V. Analytical and Bioanalytical Chemistry, 2005, 381(1): 165. [85] Scatena L F, Brown M G, Richmond G L. Science, 2001, 292(5518): 908. [86] Sakai A, Sasaki N, Tamate T, et al. Ferroelectrics, 2003, 284: 15. [87] Kneipp K, Wang Y, Kneipp H, et al. Physical Review Letters, 1997, 78(9): 1667. [88] Gucciardi P G, Trusso S, Vasi C, et al. Physical Chemistry Chemical Physics, 2002, 4(12): 2747. [89] Gucciardi P G, Trusso S, Vasi C, et al. Applied Optics, 2003, 42(15): 2724. [90] Webster S, Batchelder D N, Smith D A. Applied Physics Letters, 1998, 72(12): 1478. [91] Webster S, Smith D A, Batchelder D N, et al. Synthetic Metals, 1999, 102(1-3): 1425. [92] Anger P, Feltz A, Berghaus T, et al. Journal of microscopy, 2003, 209(Pt 3): 162. [93] Zhang P, Smith S, Rumbles G, et al. Langmuir, 2005, 21(2): 520. [94] Albano E V, Daiser S, Ertl G, et al. Physical Review Letters, 1983, 51(25): 2314. [95] Stockle R M, Deckert V, Fokas C, et al. Vibrational Spectroscopy, 2000, 22(1-2): 39. [96] Fokas C, Deckert V. Applied Spectroscopy, 2002, 56(2): 192. [97] Imura K, Okamoto H, Hossain M K, et al. Nano Letters, 2006, 6(10): 2173. [98] Xu H, Kaell M. ChemPhysChem, 2003, 4(9): 1001.