Abstract：(1) In this paper type 316 stainless steel metal plate as the research object, the selection of sample detecting position was studied when thin film method X-ray fluorescence measurement was conducted. The study showed that the optimal location for the sample detection was sample distance X-ray tube and detector baseline 1cm with the baseline into a 16°angle. (2) Heavy metal pollutants of Pb, Cd and Cr in industrial ambient air as the main analysis object, when thin film method X-ray fluorescence conducted with lead plate protection, X-rays will penetrate the membrane and continuely stimulate the protective lead plate. Therefore there is lead spectral line interference in the filter membrane background spectrum, which will affect the detection of lead element in real samples. Studies show that when a layer of isolating material was applied between the thin sample and the protective lead plate, the interference of lead line can effectively be avoided. (3) Several rigid insulating material of type 316 stainless steel, brass, aluminum, red copper and PTEE as lead inner material were selected and studied. The study results showed that compared with X-ray fluorescence spectra of other lead inner materials, the X-ray fluorescence spectrum of red copper contained the least element spectral lines. There were not Cr, Cd and Pb spectrum peaks in the X-ray fluorescence spectrum of red copper. And the target timber scattering spectrum intensity in the high energy part was weaker compared to other X-ray fluorescence spectrum. The above analysis shows that red copper has the minimal disturbance to the actual measurement of heavy metals Cr, Cd and Pb. At the same time, red copper as lead inner materials can effectively avoid the interference of lead spectrum line in lead plate. So red copper is the best lead plate inner materials in thin film method X-ray fluorescence spectroscopy measurement. This study provides an important theoretical basis for the assembling and setting up air and water weight metal X-ray fluorescence spectrometer.
Key words：Spectroscopy;XRF;Thin film method;Lead protection;Heavy metal
甘婷婷，张玉钧*，赵南京，殷高方，董欣欣，王亚萍，刘建国，刘文清 . 薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究 [J]. 光谱学与光谱分析, 2015, 35(01): 252-257.
GAN Ting-ting, ZHANG Yu-jun*, ZHAO Nan-jing, YIN Gao-fang, DONG Xin-xin, WANG Ya-ping, LIU Jian-guo, LIU Wen-qing. The Study of Selecting Sample Detecting Position and Lead Plate Inner Material in Thin Film Method X-Ray Fluorescence Measurement . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2015, 35(01): 252-257.
[1] Antosz F J, Xiang Y Q, Diaz A R, et al. Journal of Pharmaceutical and Biomedical Analysis, 2012, 62: 17. [2] Peng Y Z, Huang Y M, Yuan D X, et al. Chinese Journal of Analytical Chemistry, 2012, 40(6): 877. [3] LIU Yan-de, WAN Chang-lan, SUN Xu-dong, et al(刘燕德, 万常斓, 孙旭东, 等). Laser & Infrared(激光与红外), 2011, 41(6): 605. [4] Ye H J, Liao X F, Guo S L, et al. Advanced Materials Research, 2012, (518-523): 1510. [5] Gutierrez-Gines M J, Pastor J, Hernandez A J. Environmental Science Processes and Impacts, 2013, 15: 1545. [6] Aranda P R, Colombo L, Perino E, et al. X-Ray Spectrom., 2013, 42: 100. [7] Margui E, Hidalgo M, Queralt I, et al. Spectrochimica Acta Part B, 2012, 67: 17. [8] JI Ang, ZHENG Nan, WANG He-jin, et al(吉 昂, 郑 南, 王河锦, 等). Rock and Mineral Analysis(岩矿测试), 2011, 30(5): 528. [9] Vanhoof C, Chen H, Berghmans P, et al. X-Ray Spectrom., 2003, 32: 129. [10] LIU Xiu-feng(刘秀风). Seek Midical and Ask the Mdicine(求医问药), 2012, 10(12): 508. [11] ZHU Shi-lin, FENG Xi-dan, DANG Zhi(朱石嶙, 冯茜丹, 党 志). Earth and Environment(地球与环境), 2008, 36(1): 26.
