Simultaneous Determination of Cr, Cd, Br, Pb, and Hg of Regulated Substances in Electrotechnical Products by XRF Spectrometry
SONG Wu-yuan1, ZHENG Jian-guo1, XIAO Qian1, ZHOU Ming-hui1,LIU Zhi-hong2,LIU Li2
1. Guangdong Exit-Entry Inspection and Quarantine Bureau, Guangzhou 510623, China 2. Shenzhen Exit-Entry Inspection and Quarantine Bureau, Shenzhen 518045, China
Abstract：The objective of the present research was to develop a nondestructive technique for the analysis of heavy elements of regulated substances in electrotechnical products using an XRF spectrometer. Reference samples were prepared with in-house reference materials containing the elements Cr, Cd, Br, Pb, and Hg, and calibration curves of all elements exhibited a good linearity from 100 to 1 500 mg·kg-1. Thus, the calibration curve method was effective in the determination of heavy elements in electrotechnical products. The minimum detection limits (MDLs) calculated with reference material (BCR-681) ranged from 0.27 (Br) to 1.10 mg·kg-1 (Cd). The interference from background and spectra overlap was discussed. The matrix effect was corrected by experience coefficients, using scattered radiation as an internal standard. The accuracy of the method was evaluated by the analysis of certified reference material of BCR-681. The results are in agreement with certified values with a precision of less than 5.0%.
Key words：X-ray fluorescence analysis;Toxic heavy element;Electrotechnical products
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