Abstract:Models based on microfacet were used to describe spectropolarimetric BRDF (short for bidirectional reflectance distribution function) with experimental data. And the spectropolarimetric BRDF values of targets were measured with the comparison to the standard whiteboard, which was considered as Lambert and had a uniform reflectance rate up to 98% at arbitrary angle of view. And then the relationships between measured spectropolarimetric BRDF values and the angles of view, as well as wavelengths which were in a range of 400-720 nm were analyzed in details. The initial value needed to be input to the LM optimization method was difficult to get and greatly impacted the results. Therefore, optimization approach which combines genetic algorithm and Levenberg-Marquardt (LM) was utilized aiming to retrieve parameters of nonlinear models, and the initial values were obtained using GA approach. Simulated experiments were used to test the efficiency of the adopted optimization method. And the simulated experiment ensures the optimization method to have a good performance and be able to retrieve the parameters of nonlinear model efficiently. The correctness of the models was validated by real outdoor sampled data. The parameters of DoP model retrieved are the refraction index of measured targets. The refraction index of the same color painted target but with different materials was also obtained. Conclusion has been drawn that the refraction index from these two targets are very near and this slight difference could be understood by the difference in the conditions of paint targets’ surface, not the material of the targets.
Key words:Painted target;GALM optimization algorithm;Spectropolarimetric BRDF;Microfacet model
陈 超,赵永强,罗 丽,潘 泉,程咏梅,王 凯 . 基于遗传LM算法的涂层目标光谱偏振BRDF建模分析[J]. 光谱学与光谱分析, 2010, 30(03): 729-734.
CHEN Chao,ZHAO Yong-qiang,LUO Li,PAN Quan,CHENG Yong-mei,WANG Kai . Model and Analysis of Spectropolarimetric BRDF of Painted Target Based on GA-LM Method . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2010, 30(03): 729-734.
[1] Nicodemus F E, Hsia J C. National Bureau of Standards (U. S. ) Monograph, 1977. [2] Robert L Cook, Kenneth E Torrance. ACM Tansactions on Graphic, 1982, 1(1): 7. [3] Thilak V, Creusere C D, Voelz D G. Image Processing. ICIP. IEEE International Conference on, 2007, 4: 121. [4] Zallat J, Grabbling P, Takakura Y. Image Processing. ICIP. Proceedings. International Conference, 2003, 3: 327. [5] Wolff L B. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1990, 12(11): 1059. [6] Hua Chen, Lawrence B Wolff. International Journal of Computer Vision 1998, 28(1): 73. [7] YU Fa-jun, ZHAO Yuan-li, LIU Wei, et al(余发军, 赵元黎, 刘 伟, 等). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2008, 28(10): 2396. [8] ZHAO Yong-qiang, GONG Peng, PAN Quan. IEEE Transactions on Geoscience and Remote Sensing, 2008, 46(10): 3337. [9] CAO Yun-hua, WU Zhen-sen, ZHANG Han-lu, et al(曹运华, 吴振森, 张涵璐, 等). Acta Optica Sinica(光学学报), 2008, 28(4): 792. [10] Feng Weiwei,Wei Qingnong. Infrared Physics & Technology, 2008, 51(6): 559. [11] LIU Jia, FAN Wen-yi (刘 佳, 范文义). Remote Sensing Technology and Application(遥感技术与应用), 2008, 23(1): 104. [12] XI Yu-geng, CHAI Tian-you, YUN Wei-min(席裕庚,柴天佑,恽为民). Control Theory and Application(控制理论与应用), 1996, 13(6): 697. [13] Madsen K,Nielsen H B,Tingleff O. Informatics and Mathematical Modelling, Technical University of Denmark, DTU, 2004, 24. [14] SONG Fang-ni, FAN Wen-jie, LIU Qiang, et al(宋芳妮, 范闻捷, 刘 强, 等). Journal of Remote Sensing(遥感学报), 2007, 11(3): 296. [15] Shell James R, Schott John R. Proceedings of SPIE, the International Society for Optical Engineering, 2005, 5811: 34. [16] SONG Kai-shan, ZHAO Yun-sheng, ZHANG Bai(宋开山, 赵云升, 张 柏). Chinese Journal of Soil Science(土壤通报), 2004, 35(4): 420. [17] CHEN Chao, ZHAO Yong-qiang, CHENG Yong-mei, et al(陈 超, 赵永强, 程咏梅, 等). Journal of Opotoelectronics Laser(光电子激光), 2009, 20(3): 369. [18] YANG Tie-heng, ZHAO Yong-qiang, PAN Quan, et al(杨铁恒, 赵永强, 潘 泉, 等). Acta Photonica Sinica(光子学报), 2008, 39(12): 2520. [19] Richard G Priest,Steven R Meier. Optical Engineering, 2002, 41(5): 988. [20] Torrance K E,Sparrow E M. Journal of the Optical Society of America, 1967, 57(9): 1105.