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SPECTROSCOPY AND SPECTRAL ANALYSIS  2017, Vol. 37 Issue (03): 685-691    DOI: 10.3964/j.issn.1000-0593(2017)03-0685-07
光谱学与光谱分析 |
Radiation Temperature Measurement Technology Based on the Basis of Spectral Emissivity Function
ZHU Ze-zhong1,2, SHEN Hua1,2*, WANG Nian1,2, ZHU Ri-hong1,2
1. School of Electronic Engineering and Photoelectric Technology, Nanjing University of Science& Technology, Nanjing 210094, China2. Key Laboratory of Advanced Solid-State Laser Technology, Ministry of Industry and Information Technology, Nanjing University of Science& Technology,Nanjing 210094, China