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SPECTROSCOPY AND SPECTRAL ANALYSIS  2015, Vol. 35 Issue (01): 252-257    DOI: 10.3964/j.issn.1000-0593(2015)01-0252-06
光谱学与光谱分析 |
The Study of Selecting Sample Detecting Position and Lead Plate Inner Material in Thin Film Method X-Ray Fluorescence Measurement
GAN Ting-ting, ZHANG Yu-jun*, ZHAO Nan-jing, YIN Gao-fang, DONG Xin-xin, WANG Ya-ping, LIU Jian-guo, LIU Wen-qing
Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China