| 光谱学与光谱分析 |
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| Research on VOC Concentration Detection by Photoelastic Modulation Infrared Spectrum Absorption Method |
| HU Miao1,2, WANG Tai-yong1，2, QIAO Zhi-feng1，2, GENG Bo1，2, XIAO Xin-hua1,2 |
1. School of Mechanical Engineering, Tianjin University, Tianjin 300072, China
2. Institute of Digital Manufacturing and Measure-Control Technology，Tianjin 300072, China |
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Abstract In order to ensure high stability and strong anti-interference ability in static interference system for qualitative and quantitative analysis of gas, a static scans interference detection system was designed based on photoelastic modulation infrared spectrum absorption system. The system consists of infrared laser, polarizer, photoelastic modulator, polarization analyzer and CCD components. By photoelastic modulator the principal refractive index of optical crystal will change cyclically by the modulation signal, producing cyclical changes in the optical path difference. With the calculation of modulation phase variation, the authors can get the function of the crystal length, the modulation cycle, and the range of optical path difference. Based on phase delay value and the energy distribution of interference pattern, the authors got the formula for the corresponding interference light intensity. The experiment used ZnSe crystal as the photoelastic modulation crystal, the polarizer uses the DOP3212 polarizer, and the detector uses the TCD5390AP array CCD. The five groups have different concentrations with three common VOC gases (formaldehyde, benzene and xylene) for detecting the concentrations of gases. The experimental results with the traditional infrared absorption were compared with the test results of photoelastic modulation infrared spectrum absorption method. The method of photoelastic modulation infrared spectrum absorption had high stability and real-time features, while the detection accuracy is better than the traditional infrared absorption method.
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Received: 2011-05-18
Accepted: 2011-08-20
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Corresponding Authors:
HU Miao
E-mail: mhu@tju.edu.cn
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