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SPECTROSCOPY AND SPECTRAL ANALYSIS  2010, Vol. 30 Issue (08): 2030-2034    DOI: 10.3964/j.issn.1000-0593(2010)08-2030-05
光谱学与光谱分析 |
Theoretical Analysis and Experimental Measurement for Secondary Electron Yield of Microchannel Plate in Extreme Ultraviolet Region
LI Min1,2, NI Qi-liang1, DONG Ning-ning1,2, CHEN Bo1*
1. State Key Laboratory of Applied Optics,Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China2. Graduate University of Chinese Academy of Sciences,Beijing 100049,China