加入收藏  设为首页
 
Home | 中文  
   Home   |   About Journal   |   Editorial Board   |   Instruction   |   Rewarded   |   Indexed-in   |   Impect Factor   |   Subscriptions   |   Contacts Us
SPECTROSCOPY AND SPECTRAL ANALYSIS  2005, Vol. 25 Issue (02): 270-273
光谱学与光谱分析 |
Study on the Measurement of Residual Stresses around Indentations in SiC/Al2O3 Nanocomposite Using Fluorescence
TAO Jie,CUI Yi-hua,LI Yang
Institute of Nanomaterials, Nanjing University of Aeronautics & Astronautics, Nanjing 210016, China