光谱学与光谱分析 |
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Fabrication and Spectral Analysis of a Novel Panel Full Color Device |
NIU Lian-bin1,2,XU Zheng2, 3, TENG Feng2,ZHANG Fu-jia1*, WANG Yong-sheng2, XU Xu-rong2 |
1. School of Physics and Science Technology, Lanzhou University, Lanzhou 730000, China 2. Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044, China 3. Tianjin University Postdoctoral Working Station, Economical and Technological Development Area Postdoctoral Working Station, Tianjin Zhong-huan San-jin Co. Ltd., Tianjin 300457, China |
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Abstract It is demonstrated that a new solid-state cathodoluminescence device based on accelerated electron in SiO2 can be fabricated using organic light emitting materials as a fluorescent film. This device (the device of sandwiched structure) is composed of a glass substrate, an ITO layer, a double SiO2 films, and an organic fluorescent film. When a bias voltage is applied to the devices, they can uniformly emit red, green, and blue light. To some extent, when the voltage is low, the red (green) emission is obtained;and when the voltage is high, the blue emission is acquired. These emissions belong to the solid-state cathodoluminescence, they originate from the accelerated electrons in SiO2, which bombard the organic layers. Their devices have achieved full color (RGB) lighting and improved blue emitting.
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Received: 2005-08-08
Accepted: 2005-11-16
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Corresponding Authors:
ZHANG Fu-jia
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Cite this article: |
NIU Lian-bin,XU Zheng,TENG Feng, et al. Fabrication and Spectral Analysis of a Novel Panel Full Color Device[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2006, 26(11): 2007-2010.
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URL: |
https://www.gpxygpfx.com/EN/Y2006/V26/I11/2007 |
[1] Burroughes J H, Bradley D D C, Brown A R, et al. Nature, 1990, 347: 539. [2] Tang C W, Vanslyke S A. Appl. Phys. Lett., 1987, 51: 913. [3] File of the Future Display Technology, 2004, 8: 36. [4] CAI Jun, LOU Li-ren, XIA Shang-da, et al(蔡 军, 楼立人, 夏上达, 等). J. China University Science and Technology(中国科学技术大学学报), 1995, 25: 37. [5] CHEN Li-chun, DENG Zhen-bo, XU Xu-rong, et al(陈立春, 邓振波, 徐叙瑢, 等). Chinese Journal of Luminescence(发光学报), 1995, 16: 124. [6] Yoshiki Nakajima, Akira Kojima, et al. Appl. Phys. Lett., 2002,81:2472. [7] Zheng Xu, Chong Qu, Feng Teng, et al. Appl. Phys. Lett., 2005, 86: 1911. [8] Xu X L, Xiao H C, Hou Y B, et al. Chem. Phys. Lett., 2000, 325: 420. [9] MEI Zeng-xia, ZHANG Xi-qing, WANG Zhi-jian, et al(梅增霞, 张希清, 王志坚, 等). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2003,23(3):461. [10] Zhao H, Wang Y S, Xu Z. J. Phys.: Conden. Mat., 1999, 11: 2145. [11] ZHOU Rui, AN Zhong-wei, CHAI Sheng-yong(周 瑞,安忠维,柴生勇). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2004,24(8):922.
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