Investigation of Characteristic Microstructures of Adhesive Interface in Wood/Bamboo Composite Material by Synchrotron Radiation X-Ray Phase Contrast Microscopy
PENG Guan-yun1, WANG Yu-rong2*, REN Hai-qing2, YANG Shu-min3, MA Hong-xia4, XIE Hong-lan1, DENG Biao1, DU Guo-hao1, XIAO Ti-qiao1*
1. Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China 2. Research Institute of Wood Industry, Chinese Academy of Forestry, Beijing 100091, China 3. International Center for Bamboo and Rattan, Beijing 100102, China 4. Forest Research Institute of Guangdong Province, Guangzhou 510520, China
Abstract：Third-generation synchrotron radiation X-ray phase-contrast microscopy (XPCM) can be used for obtaining image with edge enhancement, and achieve the high contrast imaging of low-Z materials with the spatial coherence peculiarity of X-rays. In the present paper, the characteristic microstructures of adhesive at the interface and their penetration in wood/bamboo composite material were investigated systematically by XPCM at Shanghai Synchrotron Radiation Facility (SSRF). And the effect of several processing techniques was analyzed for the adhesive penetration in wood/bamboo materials. The results show that the synchrotron radiation XPCM is expected to be one of the important precision detection methods for wood-based panels.
彭冠云1，王玉荣2*，任海青2，杨淑敏3，马红霞4，谢红兰1，邓 彪1，杜国浩1，肖体乔1* . 基于同步辐射X射线相衬显微CT技术的竹木复合材料胶合界面特征研究[J]. 光谱学与光谱分析, 2013, 33(03): 829-833.
PENG Guan-yun1, WANG Yu-rong2*, REN Hai-qing2, YANG Shu-min3, MA Hong-xia4, XIE Hong-lan1, DENG Biao1, DU Guo-hao1, XIAO Ti-qiao1*. Investigation of Characteristic Microstructures of Adhesive Interface in Wood/Bamboo Composite Material by Synchrotron Radiation X-Ray Phase Contrast Microscopy. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2013, 33(03): 829-833.
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