Abstract:Ag nanocrystal-embedded silicon oxide (SiO2∶Ag) films with varying Ag fractions were prepared on p-Si substrate by magnetron co-sputtering and thermal annealing. Visible electroluminescence (EL) was observed from the structures of ITO/SiO2∶Ag/p-Si. The authors found that Ag nanocrystals in the SiO2 film can not only shift the EL peak evidently but also enhance the EL intensity markedly. The larger the Ag fractions in the EL structures, the longer the peak wavelengths. The electromagnetic interactions of the Ag nanocrystals with the emitters in the film via local surface plasmons are considered responsible for these experimental results.
冉广照,文 杰,尤力平,徐万劲. Ag纳米颗粒对富Ag二氧化硅薄膜电致发光谱的影响[J]. 光谱学与光谱分析, 2011, 31(09): 2324-2327.
RAN Guang-zhao, WEN Jie, YOU Li-ping, XU Wan-jin. Effects of Ag Nanocrystals on Electroluminescence in Si Oxide Films . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2011, 31(09): 2324-2327.
[1] Baida H, Billaud P, Marhaba S, et al. Nanoletters, 2009, 9: 3463. [2] Mertens H, Polman A. Appl. Phys. Lett., 2006, 89: 211107. [3] Sukmanowski J, Viguié J R, Nlting B, et al. J. Appl. Phys., 2005, 97: 104332. [4] Ph Blondeau J, Catan F, Andreazza-Vignolle C, et al, Plasmonics, 2008, 3: 65. [5] Han H F, Fang Y, Li Z P, et al. Appl. Phys. Lett., 2008, 92: 023116. [6] Cade N I, Ritman-Meer T, Kwakwa K A, et al. Nanotechnology, 2009, 20: 285201. [7] Su K H, Wei Q H, Zhang X. Appl. Phys. Lett., 2006, 88: 063118. [8] Ye S J, Lu Y. J. Phys. Chem., 2008, C112: 8767. [9] Sun Y G, Wiederrecht G P. Small, 2007, 3: 1964. [10] Nie S, Emory S R, Science, 1997, 275: 1102. [11] Lajos G, Jancura D, Miskovsky P, et al. J. Phys. Chem., 2008, C112: 12974. [12] Tam F, Goodrich G P, Johnson B R, et al. Nano Letters, 2007, 7: 496. [13] Pillai S, Catchpole K R, Trupke T, et al. Appl. Phys. Lett., 2006, 88: 161102. [14] Qin G G, Li A P, Zhang B R, et al. J. Appl. Phys., 1995, 78: 2006. [15] Wu X M, Dong Y M, Zhuge L J, et al. Appl. Phys. Lett., 2001, 78: 4121. [16] Chance R R, Prock A, Silbey, Adv. Chem. Phys., 1978, 37: 1. [17] Wedge S, Hooper I R, Sage I, et al. Phys. Rev. B, 2004, 69: 245418.