Abstract：The authors investigated the property of cathodluminescence-like(CL-like) emission in the device of MEH-PPV sandwiched between two SiO2 layers. The authors observed in addition to the inherent electroluminescence of MEH-PPV, a shorter emission peak which is considered to be corresponding to HOMO-LUMO transition. From the relative change of these two peaks with the variation of the thickness of SiO2, The authors studied the electron acceleration ability of SiO2.
刘姗姗，滕 枫，徐 征，刘 明，孙世菊，徐叙瑢 . SiO2厚度对类阴极射线发光中电子加速的影响 [J]. 光谱学与光谱分析, 2004, 24(07): 790-794.
LIU Shan-shan, TENG Feng, XU Zheng, LIU Ming, SUN Shi-ju, XU Xu-rong . The Influence of Thickness of SiO2 on the Electron Acceleration in Cathodluminescence-Like Emission . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2004, 24(07): 790-794.
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