Determination of Trace Impurities in High Purity Titanium Dioxide by High Resolution Inductively Coupled Plasma Mass Spectrometry
HE Xiao-mei1,XIE Hua-lin1,NIE Xi-du1,TANG You-gen2
1. Department of Chemistry, Hunan Institute of Technology, Hengyang 421008, China 2. College of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China
Abstract：An analytical method using high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS) for the rapid simultaneous determination of twenty six elements (Be, Na, Mg, Al, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Mo, Cd, Sn, Sb, Ba, Ce, Nd, Sm, Pt, Pb and Bi) in high purity titanium dioxide was described. Samples were decomposed by (NH4)2SO4 and H2SO4. Most of the spectral interferences could be avoided by measuring in the high-resolution mode. The matrix effects due to the presence of excess sulfuric acid and Ti were evaluated. The optimum conditions for the determination were tested and discussed. The standard addition method was employed for quantitative analysis. The detection limits are 0.004-0.63 μg·g-1,the recovery ratio is 87.6%-106.4%, and the RSD is less than 3.5%. The method is accurate, quick and convenient. It has been applied to the determination of trace impurities in high purity titanium dioxide with satisfactory results.
何晓梅1,谢华林1,聂西度1,唐有根2 . 高分辨等离子体质谱法测定高纯二氧化钛中痕量杂质[J]. 光谱学与光谱分析, 2007, 27(06): 1192-1196.
HE Xiao-mei1,XIE Hua-lin1,NIE Xi-du1,TANG You-gen2 . Determination of Trace Impurities in High Purity Titanium Dioxide by High Resolution Inductively Coupled Plasma Mass Spectrometry . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2007, 27(06): 1192-1196.
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