四线法弱发光样品绝对量子产率的测量
郑永丽1, 张晓东2, 周永丰1

Measurement of Absolute Quantum Yield of Weak Luminescence Samples by Four-Line Method
ZHENG Yong-li1, ZHANG Xiao-dong2, ZHOU Yong-feng1
四线法绝对量子产率测量示意图 (a): 荧光分光光度计光路图; (b): 积分球; (c): 衰减片