SnO高压结构稳定性和电学性能研究
刘涛
, 黄宇轩, 高金金, 王世霞
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Study of Structural Stability and Electrical Properties Under High Pressure of SnO
LIU Tao
, HUANG Yu-xuan, GAO Jin-jin, WANG Shi-xia
*
SnO的XRD衍射图谱(黑线), 四方晶系结构SnO标准XRD卡片(红线), 入射波长 λ = 1.540 6 Å