轻元素荧光分析用多层膜分光晶体的制备与表征
王子乐, 张哲*, 张云学, 项丝梦, 魏振博, 温圣优, 王占山

Fabrication and Characterization of Multilayer Analyzer Crystals for X-Ray Fluorescence Analysis on Light Elements
WANG Zi-le, ZHANG Zhe*, ZHANG Yun-xue, XIANG Si-meng, WEI Zhen-bo, WEN Sheng-you, WANG Zhan-shan
W/B4C多层膜 (a): GIXR测试曲线( d =3.63 nm); (b): GIXR测试曲线( d =2.85 nm); (c): GIXR测试和拟合结果( d =3.63 nm); (d): GIXR测试和拟合结果( d =2.85 nm); (e): 周期厚度均匀性( d =3.63 nm); (f): 周期厚度均匀性( d =2.85 nm)