光谱学与光谱分析 |
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Precision Measurement of the Birefringence of Quartz Crystal at 1 310 nm Based on the Spectroscopic Ellipsometer |
HAN Pei-gao, HAO Dian-zhong, SONG Lian-ke, SU Fu-fang, SHI Meng, Lü Ting-fen, WU Fu-quan, LI Guo-hua |
Shandong Provincial Key Laboratory of Laser Polarization and Information Technology, Laser Institute, Qufu Normal University, Qufu 273165, China |
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Abstract In order to get the precision measurement of birefringence of quartz crystal at the communication wavelength1310nm, based on the principle of precision measurement of phase difference between P and S polarized lights of spectroscopic ellipsometer, a method for precision measurement of birefringence of crystal was designed through the analysis of the Jones matrix under the transmission mode, and the precision measurement of birefringence of quartz crystal at 1 310 nm at room temperature (22 ℃) was made, the measuring results and error analysis show that the precision reached 10-6 level, this is the most precise birefringence parameter available, and it is of important significance for the improvement of designing precision of phase retardation devices of quartz.
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Received: 2011-07-08
Accepted: 2011-09-28
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Corresponding Authors:
HAN Pei-gao
E-mail: pghan@foxmail.com
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