| 光谱学与光谱分析 |
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| XPS Spectra of Langmuir-Blodgett Films and Their Electroluminescence |
| OUYANG Jian-ming1，BAI Yu1，YU Gui2，WANG Shi2，LIU Yun-qi2，LI Yong-fang2，ZHU Dao-ben2 |
1. Department of Chemistry, Ji′nan University, Guangzhou 510632, China
2. Center for Molecular Science, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080，China |
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Abstract The coordination of monolayer of amphiphilic ligands, N, N-bis(8-quinolinyl)alkyl propanediamide, H2A(alkyl=dodecyl, H2A12; hexadecyl, H2A16) with Cu2＋ at air-water interface was investigated by X-ray Photoelectron Spectroscopy (XPS) and UV-Ｖis spectra.The collapse pressure of the monolayers of H2A12 and H2A16 increased from 12.5 and 15.6 mN·m-1 to 28.0 and 33.8 mN·m-1 after their coordination with Cu2＋ ions, respectively. XPS indicated that the coordination ratio between H2A and Cu2＋ was 1∶1. The binding energies of Cu2p were 935 and 955 eV. The Langmuir-Blodgett(LB) films of H2A12 and H2A16 can be used as transporting materials in three-layer electroluminescence devices: ITO/TPD/LB films/Alq3/Al. The driving voltages were 6.5 and 7.5 V, the maximum luminances were 621 and 201 cd·m-2, respectively.
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Received: 2003-01-13
Accepted: 2003-06-10
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Corresponding Authors:
OUYANG Jian-ming
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| Cite this article: |
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OUYANG Jian-ming,BAI Yu,YU Gui, et al. XPS Spectra of Langmuir-Blodgett Films and Their Electroluminescence[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2004, 24(04): 499-501.
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| URL: |
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http://www.gpxygpfx.com/EN/Y2004/V24/I04/499 |
[1] Shih H T, Lin C H, Shih H H et al. Adv. Mater., 2002, 14: 1409.
[2] OUYANG Jian-ming, ZHENG Wen-jie, HUANG Ning-xing et al(欧阳健明，郑文杰，黄宁兴等). Acta Chimica Sinica(化学学报)，1999，57(4)：333.
[3] OUYANG Jian-ming(欧阳健明). Principle and Application of Langmuir-Blodgett(LB膜原理与应用). Guangzhou(广州)：Ji′nan University Press(暨南大学出版社)，1999.
[4] OUYANG Jian-ming, ZHENG Wen-jie, HUANG Ning-xing et al. Thin Solid Films, 1999, 340(1-2)：257.
[5] OUYANG Jian-ming, XUE P et al. Chem. Lett., 2001, (2): 104.
[6] OUYANG Jian-ming, Ling W H,Yang C H et al. Mater. Sci. Eng. B, 2001, 85(2-3)：247.
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