光谱学与光谱分析 |
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Determination of Trace Impurities in High Purity Titanium Dioxide by High Resolution Inductively Coupled Plasma Mass Spectrometry |
HE Xiao-mei1,XIE Hua-lin1,NIE Xi-du1,TANG You-gen2 |
1. Department of Chemistry, Hunan Institute of Technology, Hengyang 421008, China 2. College of Chemistry and Chemical Engineering, Central South University, Changsha 410083, China |
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Abstract An analytical method using high resolution inductively coupled plasma mass spectrometry (HR-ICP-MS) for the rapid simultaneous determination of twenty six elements (Be, Na, Mg, Al, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Mo, Cd, Sn, Sb, Ba, Ce, Nd, Sm, Pt, Pb and Bi) in high purity titanium dioxide was described. Samples were decomposed by (NH4)2SO4 and H2SO4. Most of the spectral interferences could be avoided by measuring in the high-resolution mode. The matrix effects due to the presence of excess sulfuric acid and Ti were evaluated. The optimum conditions for the determination were tested and discussed. The standard addition method was employed for quantitative analysis. The detection limits are 0.004-0.63 μg·g-1,the recovery ratio is 87.6%-106.4%, and the RSD is less than 3.5%. The method is accurate, quick and convenient. It has been applied to the determination of trace impurities in high purity titanium dioxide with satisfactory results.
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Received: 2006-05-06
Accepted: 2006-08-02
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Corresponding Authors:
HE Xiao-mei
E-mail: hualinxie@vip.163.com
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Cite this article: |
HE Xiao-mei,XIE Hua-lin,NIE Xi-du, et al. Determination of Trace Impurities in High Purity Titanium Dioxide by High Resolution Inductively Coupled Plasma Mass Spectrometry [J]. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2007, 27(06): 1192-1196.
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URL: |
https://www.gpxygpfx.com/EN/Y2007/V27/I06/1192 |
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