The Research of Flatfielding Correction Method for Spatial Heterodyne Spectrometer at Systematic Level
SHI Hai-liang1, 2, LI Zhi-wei1, 2, LUO Hai-yan1, 2, XIONG Wei1, 2
1. Key Laboratory of Optical Calibration and Characterization of Chinese Academy of Sciences,Hefei 230031, China 2. Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China
Abstract:It can’t satisfy the requirement of correction for response non-uniformity at systematic levelif only if the array detector for spatial heterodyne spectrometer is corrected. Traditional methods, such as irradiation with uniform source and column-flat-fielding, are not suitable for spatial heterodyne spectrometer. The article expounds convection arm-blocking method for spatial heterodyne spectrometer briefly at first. This method leads to kinds of mismatches including pixel and sub-pixel level shift and rotation in a single arm data after gluing gratings. The effect of registration accuracy of flatfielding coefficients has been analyzed for the experimental breadboard. The result shows that the registration accuracy of flatfielding coefficients needs to be better than 0.1 pixel for the breadboard. The shift at pixel level is calculated by solving the rotational degree by using logarithm-polar coordinate and phase correlation method for the requirement of registration. The shift at sub-pixel level is estimated with DFT based on matrix multiplication. The flow path of flatfielding method at systematic level is concluded. The integral condition of interferometer after actual gluing is modulated by adjusting the positions of gratings slightly. The flatfielding flow path is applied to the data acquired from the modulated interferometer after gluing. Then, the result is compared with the spectrum after the correction with totally matched signal arm data. The final result shows that the spectral deviation is 0.6% between the two spectra compared with the spectral deviation of 4.1% without correction. The accuracy of recovered spectrum after correction has been improved markedly. This can be the foundation for the follow data processing.
[1] Harlander J, Roesler F L. Proc. SPIE, Instrumentation in Astronomy Ⅶ, 1990, 1235: 622. [2] Watchorn S, Roesler F L, Harlander J, et al. Proc. SPIE, UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics, 2001, 4498: 284. [3] Harlander J,Tran H T,Roesler F L, et al. Proc SPIE,EUV, X-Ray and Gamma-Ray Instrumentation for Astronomy Ⅴ, 1994, 2280:310. [4] LI Zhi-wei, XIONG Wei, SHI Hai-liang, et al(李志伟,熊 伟,施海亮,等). Acta Optica Sinica(光学学报), 2014, 34(4): 0430002. [5] O’Dell C W, Day J L, Pollock R, et al. IEEE Trans. Geosci. Remote Sens., 2011, 49(6): 2439. [6] ZHAO Bao-chang, YANG Jian-feng, XUE Bin,et al(赵葆常, 杨建峰, 薛 彬,等). Acta Photonica Sinica(光子学报),2010,39(5):769. [7] Zhao X, Xiao Z Q, Kang Q, et al. IEEE IGARSS, 2010. 4272. [8] Englert Christoph R,Harlander John M. Applied Optics, 2006, 45(19): 4583. [9] Zitova Barbara, Flusser Jan. Image and Vision Computing,2003,21:977. [10] Guizar-Sicairos Manuel, Thurman Samuel T, Fienup James R. Optics Letters, 2008, 33(2): 156. [11] YANG Chang-jiu, LI Shuang, QIU Zhen-wei, et al(杨长久,李 双,裘桢炜,等). Infrared and Laser Engineering(红外与激光工程),2013,42(1):262. [12] Roesler F L, Harlander J. Proc. SPIE, 1999, 3756: 337. [13] Harlander J, Roesler F L, Englert C R, et al. Applied Optics, 2003, 42(15): 2829. [14] LUO Hai-yan,SHI Hai-liang,LI Zhi-wei, et al(罗海燕,施海亮,李志伟,等). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2015,35(4):1116.