Abstract：Surface-enhanced Raman Spectroscopy (SERS) was a rapid non-destructive testing.It was based on detecting molecule vibrational spectrum which was adsorbed on the metallic surface. Now it was widely used in surface adsorption, electrochemical catalysis, sensors, bio-medical testing, trace amount analysis and other fields. In our experiment, copper metallic films were deposited 50nm on BK7 glass substrates by direct current magnetron sputtering. And then the films were employed for the Ar ion beam etching modification.The structure, morphology and optical properties was characterized by X-ray diffraction (XRD), Atomic Force Microscope (AFM)，spectrophotometer and Raman spectroscopy.In the XRD graph, the peak value of modify copper film were the same with the untreated film. So the structure of copper film was not change.With increasing the power of Ar ion, the surface roughness was changed, and scattered spectrum intensity was increased by surface roughness added. With Rhodamine B(Rh B) as a probe molecule, Raman scattered spectrum was detected on modify copper film.Compared with the different samples, we can find the Raman signal was enhanced by surface roughness added. It will have some value on study the principles of SERS.
丁亮亮，洪瑞金*，陶春先，张大伟. 铜薄膜等离子改性及表面增强拉曼光谱的研究 [J]. 光谱学与光谱分析, 2015, 35(11): 3082-3086.
DING Liang-liang, HONG Rui-jin*, TAO Chun-xian, ZHANG Da-wei . Study of Surface Enhanced Raman Spectroscopy on Copper Films Modified by Ion Beam. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2015, 35(11): 3082-3086.
[1] Halvorson R A, Vikesland P J. Environmental Science & Technology, 2010, 44(20): 7749. [2] Golightly R S, Doering W E, Natan M J. ACS Nano, 2009, 3(10): 2859. [3] Guerrini L, Sanchez-Cortes S, Cruz V L, et al. Journal of Raman Spectroscopy, 2011, 42(5): 980. [4] Rule K L, Vikesland P J. Environmental Science & Technology, 2009, 43(4): 1147. [5] WANG Xiao-bin, WU Rui-mei, LIU Mu-hua, et al(王晓彬，吴瑞梅，刘木华，等). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 3014, 34(6): 1566. [6] Liu Bianhua, Han Guangmei, Zhang Zhongping, et al. Analytical Chemistry, 2012, 84(1): 255. [7] Jensen L, Aikens C M, Schatz G C. Chemical Society Reviews, 2008, 37(5): 1061. [8] Otto A. Journal of Raman Spectroscopy, 2005, 36(6-7): 497. [9] Abalde-Cela S, Aldeanueva-Potel P, Mateo-Mateo C, et al. Journal of the Royal Society Interface, 2010, 7(Suppl 4): 435. [10] Fleischmann M, Hendra P J, McQuillan A J. Chemical Physics Letters, 1974, 26(2): 163. [11] Jeanmaire D L, Van Duyne R P. Journal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1977, 84(1): 1. [12] Li Jianfeng, Huang Yifan, Ding Yong, et al. Nature, 2010, 464: 392. [13] Chon H, Lim C, Ha S M, et al. Analytical Chemistry, 2010, 82(12): 5290. [14] Leopold N, Lendl B. Journal of Physical Chemistry B, 2003, 107(24): 5723. [15] Tang Huirong, Li Qingqing, Ren Yulan, et al. Chinese Chemical Letters, 2011, 22(12): 1477. [16] Baldwin J A, Vlcková B, Andrews M P, et al. Langmuir, 1997, 13(14): 3744. [17] Tessier P M, Velev O D, Kalambur A T, et al. Journal of the American Chemical Society, 2000, 122(39): 9554. [18] Lu L, Randjelovic I, Capek R, et al. Chemistry of Materials, 2005, 17(23): 5731. [19] Zhang Jiatao, Li Xiaolin, Sun Xiaoming, et al. Journal of Chemical Physics, 2005, 109(25): 12544.
