Abstract：Tritium is very important fusion materials，it has been broad applied both in military area and in civil area. It is very important to study the depth profile and composition of tritium in materials. This thesis establishes the whole simulation method for tritium b-ray induced X-ray spectrometry technique and researches the algorithm of X-ray spectra simulation, and the X-ray spectrum and the depth and composition of tritium based on simulation has been investigated to expose their relationships. The results show that there is a corresponding relationship between depth profile and X-ray spectra, and the results lay a foundation for further research on inverse problem.
Key words：Depth profile of tritium;Composition of tritium;Bremsstrahlung;Simulation
胡广春，张伟光 . 基于X射线光谱测定法分析氚深度的模拟研究[J]. 光谱学与光谱分析, 2011, 31(03): 831-834.
HU Guang-chun, ZHANG Wei-guang. Simulation of the Depth Profile of Tritium Based on X-Ray Spectrum Measurement. SPECTROSCOPY AND SPECTRAL ANALYSIS, 2011, 31(03): 831-834.
[1] Matsyama M, Torikai Y, Hara M. Nucl. Fusion, 2007, 47: S646. [2] Shua W M, Matsuyama M. Nucl Instrument and Methods in Physics Research, 2004，A521： 423. [3] WEI Xi-ye, LI Quan-feng, YAN Hui-yong(魏熙晔，李泉凤，严慧勇). Acta Physica Sinica(物理学报), 2009, 58(4): 2313. [4] DENG Shao-gui, FAN Yi-ren(邓少贵, 范宜仁). Journal of China University of Petroleum(中国石油大学学报自然科学版), 2005, 30(1)： 52. [5] RAN Shu-yang, FU Yu-chuan, LUO Zheng-ming(冉蜀阳, 傅玉川, 罗正明). Journal of Sichuan University(Natural Science Edition)(四川大学学报·自然科学版), 2004, 41(1): 101. [6] GUO Qin-lin(郭沁林). Physics(物理)，2007，36(5): 405.
