Doppler Effect on Width of Characteristic Line in Plasma Induced by Pulsed Laser Ablating Al
SONG Yi-zhong1, 2,HE An-zhi1
1. School of Science, Nanjing University of Science and Technology, Nanjing 210094, China 2. Department of Physics, Dezhou college, Dezhou 253000, China
Abstract:Aluminum (Al) plasma was induced with a pulsed Nd: YAG laser beam ablating Al target in Ar. Time-resolved information of the plasma radiation was taken with time-resolved technique, and the spectra of the radiation were recorded with an optical multi-path analyzer (OMA Ⅲ), whereupon, time-resolved spectra of the plasma radiation induced by pulsed laser were acquired. Based on the experiment data, Al resonant double lines, Al Ⅰ 396.15 nm, Al Ⅰ 394.40 nm, were respectively fitted with Lorentz, Gauss and their linear integrated function (abbr. Integrated function), whereupon, Lorentz and Gauss elements were separated from the experiment data profile curve. By contrasting Lorentz with Gauss curve separated, it was found that the experiment curve mainly consisted of Lorentz element, a with little Gauss. By contrasting Lorentz with Integrated fitting curve for experiment data, a visual picture of the characteristic lines broadened by Doppler effect was exhibited. According to the visual picture, the increase of full half-high width of the characteristic line broadened by Doppler effect was estimated. It was about 2×10-3-8×10-3 nm, approximating the theoretical value 6.7×10-3 nm. As a result, Doppler effect on the width of characteristic lines in the plasma could be reasonably explained by curve fitting analysis and theoretical calculation.
Key words:Doppler effect;Time-resolved spectra;Fitting analysis;Full half-high width of characteristic line;Characteristic line broadened
宋一中1, 2,贺安之1. 激光诱导Al等离子体中的Doppler效应[J]. 光谱学与光谱分析, 2005, 25(05): 655-659.
SONG Yi-zhong1, 2,HE An-zhi1 . Doppler Effect on Width of Characteristic Line in Plasma Induced by Pulsed Laser Ablating Al . SPECTROSCOPY AND SPECTRAL ANALYSIS, 2005, 25(05): 655-659.
[1] SONG Yi-zhong, LI Zun-ying, ZHU Rui-fu,WANG Jian-hua(宋一中, 李尊营, 朱瑞富,王建华). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2002, 22(4): 545. [2] MA Hong-liang, LU Fu-quan(马洪亮,鲁福权). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2002,22(2):183. [3] LIU Dong-feng, DU Wei-min, ZHOU He-tian et al(刘东风,杜为民,周赫田等). Spectroscopy and Spectral Anlaysis(光谱学与光谱分析),2001,21(3):301. [4] WANG Yu-fang, LIU Hao-ran, XU Xiao-xuan,SHAO Yue, CAO Xue-wei(王玉芳,刘浩然,徐晓轩,邵 悦,曹学伟). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2002,22(4):580. [5] ZHANG Gui-guang, HUANG Fen, SUN Xiao-gang(张桂广,黄 奋,孙晓纲). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2000,20(1):71. [6] SUN Zhen-hua, SUN Da-hai, GU Sheng et al(孙振华,孙大海,谷 胜等). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2000,20(1):49. [7] Watanabe A, Kawato T, Matsuda M et al. Thin Solid Films, 1998, 312: 123. [8] Stampe P A, Kennedy R J. Thin Solid Films, 1998, 326: 63. [9] Mao X L, Shannon M A, Fernandez A J et al. Applied Spectroscopy, 1995, 49(7): 1054. [10] LI Zun-ying, LIU Fu-yi(李尊营,刘复义). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2002,24(2):132. [11] Fernandez-Pradas J M, Sardin G, Cleries L et al. Thin Solid Films, 1998, 317: 393. [12] WANG Feng, JIN Ming-xing, LIU Hang et al(王 锋,金明星,刘 航等). Chinese Journal of Atomic and Molecular Physics(原子与分子物理学报), 2000, 17(3): 537. [13] Griem H R. Spectral Line Broadening by Plasma. New York: Academic Press, 1974, 63. [14] WANG Qing-pu, ZHANG Hang-yu, ZHAO Sheng-zhi(王青圃,张行愚,赵圣之). Laser Physics(激光物理学). Jinan: Shandong University Press(济南:山东大学出版社),1993. 48. [15] SONG Yi-zhong, HE An-zhi(宋一中,贺安之). Spectroscopy and Spectral Analysis(光谱学与光谱分析),2004,24(1):29. [16] ZHANG Yan-hui, SONG Yi-zhong(张延惠, 宋一中). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 2000, 20(1): 25. [17] Wang X T, Man B Y, Wang G T et al. Journal of Applied Physics, 1996, 80(3): 1783. [18] ZHANG Shu-dong, CHEN Guan-ying, YUAN Ping et al(张树东, 陈冠英, 袁 萍等). Chinese Journal of Atomic and Molecular Physics(原子与分子物理学报), 1999, 16(4): 457.