基于可变相位延迟的激光干涉式亚纳米级微位移测量系统
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A Laser Interferometric Subnano-Scale Micro-Displacement Measurement System Based on Variable Phase Retardation
LIU Tong1,2, ZHANG Liu1,*, ZHANG Guan-yu1, CHEN Chen1,*, ZHONG Zhi-cheng1
位移测量系统构架示意图(左)和局部实物照片(右)