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基于X射线光子计数探测技术的材料K-edge特性识别实验研究
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何鹏1,2, 吴晓川1, 安康2, 邓刚3, 王星3, 周仲兴4, 魏彪1,2, 冯鹏1,2,* |
Experimental Study of Material K-Edge Characteristics Identification Based on X-ray Photon-Counting Detection Technique
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HE Peng 1,2, WU Xiao-chuan 1, AN Kang 2, DENG Gang 3, WANG Xing 3, ZHOU Zhong-xing 4, WEI Biao 1,2, FENG Peng 1,2,*
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(a) 某个能谱范围内银材料投影图像中选定区域灰度分布图; (b) 设定灰度阈值后投影图像中选定区域灰度分布图; (c) 滤波后投影图像中选定区域灰度分布图 |
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