%A SUN Dong-xiao;LI Jin-hua*;FANG Xuan;;CHEN Xin-ying;FANG Fang;CHU Xue-ying;WEI Zhi-peng;;WANG Xiao-hua %T Effects of Annealing Temperature on the Structure and Optical Properties of ZnMgO Films Prepared by Atom Layer Deposition %0 Journal Article %D 2014 %J SPECTROSCOPY AND SPECTRAL ANALYSIS %R 10.3964/j.issn.1000-0593(2014)07-1789-04 %P 1789-1792 %V 34 %N 07 %U {https://www.gpxygpfx.com/CN/abstract/article_7115.shtml} %8 2014-07-01 %X In the present paper, we report the research on the effects of annealing temperature on the crystal quality and optical properties of ZnMgO films deposited by atom layer deposition(ALD). ZnMgO films were prepared on quartz substrates by ALD and then some of the samples were treated in air ambient at different annealing temperature. The effects of annealing temperature on the crystal quality and optical properties of ZnMgO films were characterized by X-ray diffraction (XRD), photoluminescence (PL) and ultraviolet-visible (UV-Vis) absorption spectra. The XRD results showed that the crystal quality of ZnMgO films was significantly improved when the annealing temperature was 600 ℃,meanwhile the intensity of(100)diffraction peak was the strongest. Combination of PL and UV-Vis absorption measurements showed that it can strongly promote the Mg content increasing in ZnMgO films and increase the band gap of films. So the results illustrate that suitable annealing temperature can effectively improve the crystal quality and optical properties of ZnMgO films.