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| Fast and High-Accuracy Measuring Technique for Transmittance Spectrum in VIS-NIR |
| WANG Sheng-hao, LIU Shi-jie*, WANG Wei-wei, ZHANG Zhi-gang |
| Key Laboratory of Materials for High-Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China |
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Abstract In this paper, based on the framework of traditional spectrophotometry, we put forward a novel fast and high-accuracy technique for measuring transmittance spectrum in VIS-NIR wave range, in which its key feature was that during the measurement procedure, the output wavelength of the grating monochromator was kept increasing continuously and at the same time, the photoelectric detectors execute d a concurrently continuous data acquisition routine. Initial experiment result showed that the newly proposed technique could shorten the time consumed for measuring the transmittance spectrum down to 50% that of the conventional spectrophotometric method, and a relative error of 0.070% and a repeatability error of 0.042% were generated. Compared with the current mostly used techniques (spectrophotometry, methods based on multi-channel spectrometer and strategy using Fourier transform spectrometer) for obtaining transmittance spectrum in VIS-NIR, the new strategy has at all once the following advantages. Firstly the measuring speed could be greatly quicken, and fast measurement of transmittance spectrum in VIS-NIR is therefore promising, which would find wide application in dynamic environment. Secondly high measuring accuracy (0.1%~0.3%) is available, and finally the measuring system has high mechanical stability because the motor of the grating monochromator is rotating continuously during the measurement.
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Received: 2017-02-24
Accepted: 2017-06-11
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Corresponding Authors:
LIU Shi-jie
E-mail: shijieliu@siom.ac.cn
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