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| A Laser Resonance Ionization Spectroscopy Apparatus for Study on Atomic Energy Level |
| WANG Wen-liang, LI Zhi-ming, SHEN Xiao-pan, XU Jiang, ZHAI Li-hua, DENG Hu, WEI Guan-yi |
| Northwest Institute of Nuclear Technology, Xi’an 710024, China |
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Abstract Laser resonance ionization spectroscopy (LRIS) is one of the element-selective spectroscopy methods, which aims to study the energy level parameters of the atom by measuring the ion signal. The atom is selectively excited and ionized by one or more lasers in LRIS. A set of totally domestic LRIS apparatus was built, which was used for measuring the parameters of the atomic high lying states. The overall structure, main technique and application of the LRIS apparatus were described in detail. The LRIS system was consisted of high precision tunable dye lasers, high efficiency laser ionization system and high resolution time of flight mass analyzer (ToF-MA). There were three sets of multimode dye laser and one set of single longitudinal mode dye laser, which were pumped by 532 nm Nd∶YAG laser. The repetition frequency of the dye laser was 10 kHz. The laser ionization system contained atomization source, atom and laser interreaction region and ion lens. The atom sprayed from the atomic source was selectively excited and ionized by lasers, and then was reshaped as ion beam with small divergence angle and narrow beam width by ion lens. The reflecting structural design, pulsing vertical repulsion technique and deflecting plate adjusting method were adopted in the ToF-MA. Based on the laser resonance ionization spectroscopy technique, the auto-ionization spectrum of uranium atom was measured with the aid of this apparatus. An efficient three-color-three-photon resonance ionization scheme of uranium atom was obtained. The center wavelengths of the lasers were 591.7, 565.0 and 632.4 nm, respectively. The isotopic shift and the hyperfine structure also can be analyzed by this apparatus. In addition, as result of the mass analyzer employment, the proposed apparatus can be used to analyze the sample component, trace element concentration, and isotopic abundance.
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Received: 2017-01-08
Accepted: 2017-05-06
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[1] Xiao Ying, Dai Changjian, Qin Wenjie. Chinese Physics B, 2010, 19(6): 63202.
[2] Blaise J, Radziemski L J. Journal of the Optical Society of America, 1976, 66(7): 644.
[3] Blaise J, Fred M, Gutmacher R G. J. Opt. Soc. Am. B: Opt. Phys., 1986, 3: 3(3): 403.
[4] Fred M, Tomkins F S, Blaise J E, et al. Journal of the Optical Society of America, 1977, 67(67): 7.
[5] Aly E S. Review of Laser Engineering, 1994, 22(3): 183.
[6] WANG Chong, TIAN Yan-shan, SHAN Xue, et al(王 崇, 田彦姗, 尚 雪, 等). Journal of Atomic and Molecular Physics(原子与分子物理学报), 2016, 33(3): 433.
[7] JIN Chang-tai, WANG Xiu-lan(金昌泰, 王秀兰). Spectroscopy and Spectral Analysis(光谱学与光谱分析), 1999, 19(1): 5.
[8] LI Zhi-ming, ZHU Feng-rong, DENG Hu, et al(李志明, 朱凤蓉, 邓 虎, 等). Journal of Atomic and Molecular Physics(原子与分子物理学报), 2006, 23(2): 185.
[9] Pilyugin I I. Technical Physics, 2016, 61(3): 446.
[10] Zhou Z Y, Wang Y, Tang X F, et al. Review of Scientific Instruments, 2013, 84(1): 14101. |
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