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| Analysis on Near Field Spatial Spectra Scattering Modeling of Metallic Nanoparticle and Microscopic Imaging |
| LIU Guo-yan1, GAO Kun2, LIU Xue-feng3, NI Guo-qiang2 |
1. College of Engineering and Technology, Tianjin Agricultural University, Tianjin 300384, China
2. Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
3. School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China |
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Abstract Polarization parameters indirect microscopic imaging, which utilizes conventional microscope as a basic light path and inserts modulations into the light path, finally, the inversion images are obtained after fitting and filtering the data obtained from the system. By analyzing the near-field spatial spectra scattering around nanoparticles to solve spatial spectra scattering. Comparing polarization parameters indirect microscopic imaging with direct imaging by using FDTD modeling, it can be found that the resolution of polarization parameters indirect microscopic imaging is much higher than conventional imaging and it can not only detect the shape and electric field distribution of nanoparticles, but also obtain much wider spatial scattering spectra.
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Received: 2016-02-24
Accepted: 2016-06-18
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