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SPECTROSCOPY AND SPECTRAL ANALYSIS  2016, Vol. 36 Issue (12): 4039-4044    DOI: 10.3964/j.issn.1000-0593(2016)12-4039-06
光谱学与光谱分析 |
Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement
GAN Ting-ting1,2, ZHANG Yu-jun1*, ZHAO Nan-jing1, YIN Gao-fang1, XIAO Xue1, ZHANG Wei3, LIU Jian-guo1, LIU Wen-qing1
1. Key Laboratory of Environmental Optics and Technology, Key Laboratory of Optical Monitoring Technology for Environment, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China2. Wanjiang Center for Development of Emerging Industrial Technology, Tongling 244000, China3. Army Officer Academy of PLA, Hefei 230031, China