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SPECTROSCOPY AND SPECTRAL ANALYSIS  2016, Vol. 36 Issue (11): 3720-3725    DOI: 10.3964/j.issn.1000-0593(2016)11-3720-06
光谱学与光谱分析 |
A Research on Filed-of-View (FOV) Widening and Thermal-Phase-Drift (TPD) Compensating Technology Applied in a Polarized Interference Imaging Spectrometer (PIIS)
ZHAI Yang1, 2, XIAO Dong1, 2, LI Bo1, 2, ZHU Ri-hong3
1. National Astronomical Observatories/Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing 210042, China2. Key Laboratory of Astronomical Optics & Technology, Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing 210042, China3. School of Electronic Engineering and Photoelectric Technology, Nanjing University of Science & Technology, Nanjing 210094, China